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Professional SILICON
CAD tool to edit design data for LSI, LCD and shadow masks.
Features
Layout examination operations can be performed in parallel with LSI layout design.- Layout editor
- Menu driven method that can cover both pop-up menus and fixed menus
- Multi-window function that displays 6 types of graphic data and 10 types of text data at one time
- Graphic compiling function in multiple windows
- Edit-in-place function
- Text editor
- Direct start-up of layout examination program
- Layout examination program
- Examination program that can be run interactively
- Real-time examination and display
- DRC
- ERC
- LPE
- LVS
- Layout debugger
- Automatic error search function that fully utilizes multiple windows
- Error report files and layouts for individual examination results
- Simultaneous display and mutual search of error graphics in data
- Simultaneous display and mutual search of node capacity values and node graphic data