November 2009 - International Symposium for Testing and Failure Analysis

TOOL Corp. is exhibiting at the 35th International Symposium for Testing and Failure Analysis on the 17th and 18th of November in San Jose, California.

Showcased is our LAVIS, an LSI CAD software that offers thorough coverage of visualized verifications in the design and manufacturing phases including design error analysis.

LAVIS can minimize your TAT of locating defective nodes through its user-friendly node management GUI also capable of checking double vias. SEM image and node trace results can be overlaid and be displayed in a 3-dimensional view, which is also effective in failure analysis to improve yield.

Don't miss this great opportunity to learn more about LAVIS !

   Symposium :   Sun - Thur, Nov 15 - 19　

   Exposition   :   Tue & Wed,  Nov 17 & 18, 9:30 - 16:00

   Venue         :   McEnery Convention Center, San Jose 

                          Booth # 124