March 2009 - SPIE Advanced Lithography 2009 Report

Thank you for visiting our booth at the "SPIE Advanced Lithography 2009" held on Feb 24 and 25 in San Jose, California.

At the show, we exhibited our fracturing systems "MaskStudio" and "MS-lite", and also gave a presentation titled, "Visual Solutions to DFM Verification" to introduce an effective visual verification method using our layout visualization platform "LAVIS".

Again, we would like to thank you for your interest in our products and please feel free to contact us if you have any further questions or requests.

TOOL at SPIE Advanced Lithography 2009

TOOL Booth

Presentation