November 2008 - LSI Testing Symposium

TOOL Corp. is exhibiting its LAVIS, a layout visualization platform, at The 28th Annual LSI Testing Symposium (LSITS) and is also giving a presentation during the commercial session. 

For LSI test designers, device manufacturers, and materials suppliers and testing equipment, LSITS provides unparalleled opportunities for testing professionals to network and learn the latest in the practical application of advanced LSI testing strategies and methodologies to achieving LSI device dependability excellence.

LAVIS's Node Trace, 3D Viewing (optional), Paste Image and other functions allow you to find various problems in manufacturing process at an early stage, analyze and fix them.  Also, its capabilities to flexibly interface with various kinds of equipment enable accurate analysis.

Visit our booth or register now for a private demo and see how easily you can utilize LAVIS in these fields.

• Symposium:               Wed. - Fri. Nov. 12 - 14 　
• Exhibition:                  Thur. -  Fri. Nov. 13 - 14, 10:00 - 17:00 
                                     Booth #1
• Commercial Session:  Thur. 13, 10:15 - 10:23 
  (C1) Advantage of using "LAVIS" LSI CAD software in error analysis and its methods
          H. Hasebe,  Marketing Communications, EDA Engineering Dept. 
• Venue:                       Senri Life Science Center (Toyonaka, Osaka)